Apply Filters
Clear All Filters
What do you want to measure?
What's the thinnest layer you want to measure?
- No (21)
Do you want a real-time image of your sample?
- Yes (21)
Optical Profilers | Model | Thickness Range |
Field-of-View | Spatial Sampling | |
---|---|---|---|---|---|
Profilm3D | Step-height and surface roughness measurements Features: VIS and PSI measurement capabilities. 100mm of motorized X, Y, and Z translation. Tip/Tilt Stage. * With 10X objective lens. | ||||
Profilm3D | 0.001-500 µm | 2.0 x 1.7 mm * | 0.88 µm * |
Single-Spot Measurements |
Model | Thickness Range |
Wavelength Range | Standard Spot Size | |
---|---|---|---|---|---|
F3 | Reflectance and film-thickness measurements Features: Compact, low-cost, non-UV systems have 40k-hour light source. * Thickness measurement capability is optional. | ||||
F3-s980 | 10-1000 µm * | 960-1000 nm | 10 μm | ||
F3-s1310 | 15-2000 µm * | 1280-1340 nm | 10 μm | ||
F3-s1550 | 25-3000 µm * | 1520-1580 nm | 10 μm | ||
F10-AR | Reflectance measurement of large flat or curved samples Features: Handheld probe for large samples and maximum versatility. * Thickness measurement capability is optional. | ||||
F10-AR | 0.2-15 µm * | 380-1050 nm | 100 μm |
Single-Spot Measurements |
Model | Thickness Range |
Wavelength Range | Standard Spot Size | |
---|---|---|---|---|---|
F10-RT | Reflectance and/or transmittance measurement Features: Simultaneous measurement of R and T. Built-in video. * Thickness measurement capability is optional. | ||||
F10-RT | 0.015-70 µm * | 380-1050 nm | 5000 μm | ||
F10-RT-EXR | 0.015-150 µm * | 380-1700 nm | 5000 μm | ||
F10-RT-NIR | 0.1-150 µm * | 950-1700 nm | 5000 μm | ||
F10-RT-UV | 0.003-40 µm * | 190-1100 nm | 5000 μm | ||
F10-RT-UVX | 0.003-150 µm * | 190-1700 nm | 5000 μm | ||
F20 | The world's best-selling thin-film measurement system Features: Our most versatile model. Includes full thickness and index measurement capabilities. | ||||
F20 | 0.015-70 µm | 380-1050 nm | 1500 μm | ||
F20-EXR | 0.015-250 µm | 380-1700 nm | 1500 μm | ||
F20-NIR | 0.1-250 µm | 950-1700 nm | 1500 μm | ||
F20-UV | 0.003-40 µm | 190-1100 nm | 1500 μm | ||
F20-UVX | 0.003-250 µm | 190-1700 nm | 1500 μm | ||
F20-XT | 0.2-450 µm | 1440-1690 nm | 1500 μm | ||
F40 | Microscope-based thin-film measurement system Features: Attach to a microscope. Very small spot size. | ||||
F40 | 0.02-20 µm | 400-850 nm | 1 μm | ||
F40-EXR | 0.02-40 µm | 400-1700 nm | 1 μm | ||
F40-NIR | 0.04-40 µm | 950-1700 nm | 1 μm | ||
F40-UV | 0.004-40 µm | 190-1100 nm | 7 μm | ||
F40-UVX | 0.004-40 µm | 190-1700 nm | 7 μm |